Is a
Patent attributes
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Lee D. Whetsel0
Date of Patent
April 18, 2017
0Patent Application Number
150773220
Date Filed
March 22, 2016
0Patent Citations Received
Patent Primary Examiner
Patent abstract
Testing of an electrical device is achieved by providing a test access mechanism within the device that can receive scan frames from an external tester. The received scan frames contain stimulus data to be applied to circuitry within the device to be tested, a command for enabling a test control operation, and a frame marker bit to indicate the end of the scan frame pattern. The inputting of scan frames can occur continuously and simultaneous with a commanded test control operation.
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