Patent attributes
Method and microscope for SPIM microscopy, wherein, in a first step, with reference to a sample to be examined, a calibration is carried out in that the actual position of the light sheet in different sample planes is detected and stored depending on the position in the sample and, in a second step, the stored position of the light sheet is utilized during observation and/or detection of the sample based on the values stored in the first step to correct the position of the light sheet relative to the focal plane of the detection objective and/or, during the displacement of the sample, an adjustment of the position of the light sheet relative to the focal plane of the detection objective is carried out such that the light sheet executes a relative movement in at least one direction relative to the sample and/or the detection objective.
