Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Hao Wang0
Yunwu Zhao0
Date of Patent
June 27, 2017
0Patent Application Number
145562280
Date Filed
November 30, 2014
0Patent Citations Received
Patent Primary Examiner
Patent abstract
In an integrated circuit, a first scan chain of flip-flops is loaded with data for testing data retention of the flip-flops and a memory is loaded with data for performing a retention test by a memory built-in self-test (MBIST) wrapper circuit. A portion of the system is placed in a low-power state for a predetermined period of time before data is read from the memory and retention of data by the memory while in the low-power state is determined.
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