US Patent 9704599 Memory circuit with assist circuit trimming

A memory device includes: a memory array comprising a plurality of bits, wherein a first bit of the plurality of bits is coupled to a first assist circuit; a test engine, coupled to the memory array, and configured to examine whether each bit is functional; and an assist circuit trimming (ACT) circuit, coupled to the memory array and the test engine, and in response to the examination, configured to selectively activate the first assist circuit.