US Patent 9704700 Sample analysis systems and methods of use thereof
Patent 9704700 was granted and assigned to Purdue Research Foundation on July, 2017 by the United States Patent and Trademark Office.
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Patent abstract
The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.
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US Patent 09704700 Sample analysis systems and methods of use thereof US Patent 9704700 Sample analysis systems and methods of use thereof
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Patent Number
0970470000
Patent Number
970470000
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Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
097047000
Date of Patent
July 11, 2017
0Patent Application Number
153178010
Date Filed
June 16, 2015
0Official Website
Patent Primary Examiner
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Is a
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
097047000
Date of Patent
July 11, 2017
0Patent Application Number
153178010
Date Filed
June 16, 2015
0Official Website
Patent Primary Examiner
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US Patent 09704700 Sample analysis systems and methods of use thereof
Infobox
Is a
Patent applicant
Current assignee
Patent jurisdiction
Patent number
09704700
Date of patent
July 11, 2017
Patent application number
15317801
Date Filed
June 16, 2015
Patent primary examiner
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