US Patent 9723784 Crop quality sensor based on specular reflectance

A crop quality sensor, comprising an illumination source, an imaging device, and a processor executing application software. The illumination source is shone onto a crop sample, and an image is taken with the imaging device of the illuminated crop sample. The software executing on the processor is used to analyze the image to identify the outlines of individual kernels and to identify which of those outlines contain a specular highlight, indicative that the kernel is whole and unbroken, while the absence of such a specular highlight is indicative of a broken kernel.