Patent attributes
A series of nominally identical production workpieces is measured on a measuring apparatus. To correct for temperature variations, one of the workpieces forms a master artifact, the dimensions of which are known. The artifact is measured on the measuring apparatus at two or more temperatures, producing two or more corresponding sets of measured dimensional values of the master artifact at the respective temperatures. One or more error maps, look-up tables, or functions are generated which relate the measured dimensional values of the artifact to the known dimensions of the artifact. The error map(s), look-up table(s) or function(s) are dependent on the respective temperatures at which the artifact was measured. Correction values derived from the error map(s), look-up table(s) or function(s) are used to correct the measurements of production workpieces in the series. These correction values are determined in dependence upon the temperature at which the workpiece measurements were obtained.
