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US Patent 9891261 Electromigration monitor
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Patent
Date Filed
June 30, 2014
Date of Patent
February 13, 2018
Patent Application Number
14320598
Patent Citations Received
US Patent 11955392 System and method for measuring device inside through-silicon via surroundings
0
US Patent 11657199 Method for analyzing electromigration (EM) in integrated circuit
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
9891261
Patent Primary Examiner
Jack Chen
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