Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
February 20, 2018
Patent Application Number
15368322
Date Filed
December 2, 2016
Patent Citations Received
Patent Primary Examiner
Patent abstract
Structures and formation methods of a semiconductor device structure are provided. The semiconductor device structure includes a fin structure over a semiconductor substrate and a gate stack covering a portion of the fin structure. The gate stack includes a work function layer and a gate dielectric layer. The semiconductor device structure also includes an isolation element over the semiconductor substrate and adjacent to the gate stack. The isolation element is in direct contact with the work function layer and the gate dielectric layer, and a lower width of the isolation element is greater than an upper width of the isolation element
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