Patent attributes
The present invention relates to handling misalignment in differential phase contrast imaging. In order to provide an improved handling of misalignment in X-ray imaging systems for differential phase contrast imaging, an X-ray imaging system (10) for differential phase contrast imaging is provided that comprises a differential phase contrast setup (12) with an X-ray source (14), an X-ray detector (16), and a grating arrangement comprising a source grating (18), a phase grating (20) and an analyzer grating (22). The source grating is arranged between the X-ray source and the phase grating, and the analyzer grating is arranged between the phase grating and the detector. Further, the system comprises a processing unit (24), and a measurement system (26) for determining a misalignment of at least one of the gratings. The X-ray source and the source grating are provided as a rigid X-ray source unit (28). The phase grating, the analyzer grating and the detector are provided as a rigid X-ray detection unit (30). The measurement system is an optical measurement system configured to determine a misalignment between the differential phase contrast setup consisting of the X-ray source unit and the X-ray detection unit. Further, the processing unit is configured to provide a correction signal (34) based on the determined misalignment.
