US Patent 9983452 Method for detecting substrate crack, substrate, and detection circuit

A method for detecting a substrate crack, a substrate, and a detection circuit. A non-closed test line having an opening is peripherally disposed along an edge of a glass substrate of a TFT substrate. Whether an edge of the TFT substrate has a crack or chip can be determined by measuring whether the test line is on or off. In this way, a detection omission can be avoided, detection efficiency is improved, and after the TFT substrate is used to assemble a liquid crystal module or the liquid crystal module is used to assemble a complete device, whether the edge of the TFT substrate in the liquid crystal module has a crack or chip can also be detected.