US Patent D573049 Testing device for electronic component

Patent D573049 was granted and assigned to Hon Hai Precision Industry Co Ltd on July, 2008 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Current Assignee

‌

Hon Hai Precision Industry Co Ltd

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

D573049

Patent Inventor Names

Chiou-Lin Fan0

Ying-Chih Huang0

Chin-Feng Chen0

Tay-Yang Lin0

Date of Patent

July 15, 2008

Patent Application Number

29275496

Date Filed

December 28, 2006

Patent Citations Received

‌

US Patent D1026694 Configurable test instrument for power equipment

Patent Primary Examiner

Antoine D. Davis

No article content yet.

Timeline

No Timeline data yet.

Further Resources

Title

Author

Link

Type

Date

No Further Resources data yet.

References

Find more entities like US Patent D573049 Testing device for electronic component

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.

Open Query Tool

Access by API