US Patent D633537 Electron microscope

Patent D633537 was granted and assigned to Hitachi on March, 2011 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Current Assignee

Hitachi

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

D633537

Patent Inventor Names

Akira Omachi0

Tomohisa Ohtaki0

Mitsuru Oonuma0

Masahiko Ajima0

Date of Patent

March 1, 2011

Patent Application Number

29356742

Date Filed

March 2, 2010

Patent Citations Received

‌

US Patent D998801 Automatic ophthalmic lenses analyzer measuring apparatus

Patent Primary Examiner

‌

Paula Greene

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