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zeroK NanoTech Corporation SBIR Phase II Award, June 2021

A SBIR Phase II contract was awarded to zeroK NanoTech Corporation in June, 2021 for $1,100,000.0 USD from the U.S. Department of Energy.

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sbir.gov/node/2104039
Is a
SBIR/STTR Awards
SBIR/STTR Awards

SBIR/STTR Award attributes

SBIR/STTR Award Recipient
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zeroK NanoTech Corporation
0
Government Agency
U.S. Department of Energy
U.S. Department of Energy
0
Award Type
SBIR0
Contract Number (US Government)
DE-SC00185600
Award Phase
Phase II0
Award Amount (USD)
1,100,0000
Date Awarded
June 17, 2021
0
End Date
June 16, 2023
0
Abstract

Secondary Ion Mass Spectrometry (SIMS) is an important tool in the study of nanoscale composition of materials; however current instrumentation is slow, requiring long data acquisition times and providing limited resolution. The overall aim of this research proposal is the development of improved SIMS instruments, made possible by new ion source technology. SIMS has been used successfully to study important processes for bioenergy, such as nutrient transport in the rhizosphere, structural characterization of cell walls, and metabolic pathways in complex systems. Researchers use SIMS to collect high-spatial-resolution maps of the elemental or isotopic composition of nanoscale samples. The limited resolution of existing SIMS instruments prevents researchers from obtaining the accurate spatial information required for a deeper understanding of these systems. Phase I was successful in developing a prototype ion source well suited for integration with SIMS instrumentation; objectives included improvements to the ion source that made it higher-performing, as well as easier to build and operate. In Phase II, ongoing through May 2021, the ion source was further refined and a new SIMS instrument was created. All objectives of Phase II except for the integration and testing of the spectrometer have been completed. During Phase II, first sales were made of technology developed under this SBIR. Phase IIB will improve commercial viability by improving manufacturability and performance of the ion source, and by upgrading the spectrometer so it can view a sample’s entire mass spectrum at once. This latter benefit will be of critical importance to early customers as well as a leap forward for SIMS analysis. When complete, this new SIMS instrument will produce elemental maps at few-nanometer resolutions, which are at fundamental physical limits of the technique. Its development will aid academic and commercial researchers developing alternative energy sources, oil and gas exploration, semiconductor technologies, and biomedical innovations. This instrument will also serve researchers exploring the evolution of biological life on Earth and astrophysical phenomena.

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