List of Jentek Sensors, Inc. patents

Patents where

Current Assignee

Name

Jentek Sensors, Inc.

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7528598 Fastener and fitting based sensing methods	Patent 7528598 was granted and assigned to Jentek Sensors, Inc. on May, 2009 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7528598	May 5, 2009
‌ US Patent 6952095 Surface mounted and scanning spatially periodic eddy-current sensor arrays	Patent 6952095 was granted and assigned to Jentek Sensors, Inc. on October, 2005 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	6952095	October 4, 2005
‌ US Patent 7451657 Material condition monitoring with multiple sensing modes	Patent 7451657 was granted and assigned to Jentek Sensors, Inc. on November, 2008 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7451657	November 18, 2008
‌ US Patent 7876094 Magnetic field characterization of stresses and properties in materials	Patent 7876094 was granted and assigned to Jentek Sensors, Inc. on January, 2011 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7876094	January 25, 2011
‌ US Patent 7518360 Hybrid wound/etched winding constructs for scanning and monitoring	Patent 7518360 was granted and assigned to Jentek Sensors, Inc. on April, 2009 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7518360	April 14, 2009
‌ US Patent 7411390 High resolution inductive sensor arrays for UXO	Patent 7411390 was granted and assigned to Jentek Sensors, Inc. on August, 2008 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7411390	August 12, 2008
‌ US Patent 9255875 Method and apparatus for inspection of corrosion and other defects through insulation	Patent 9255875 was granted and assigned to Jentek Sensors, Inc. on February, 2016 by the United States Patent and Trademark Office.	Jentek Sensors, Inc.	Jentek Sensors, Inc.	United States Patent and Trademark Office	9255875	February 9, 2016
‌ US Patent 7696748 Absolute property measurements using electromagnetic sensors	Patent 7696748 was granted and assigned to Jentek Sensors, Inc. on April, 2010 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7696748	April 13, 2010
‌ US Patent 11435317 Complex part inspection with eddy current sensors	Patent 11435317 was granted and assigned to Jentek Sensors, Inc. on September, 2022 by the United States Patent and Trademark Office.	Jentek Sensors, Inc.	Jentek Sensors, Inc.	United States Patent and Trademark Office	11435317	September 6, 2022
‌ US Patent 11543388 In-process quality assessment for additive manufacturing	Patent 11543388 was granted and assigned to Jentek Sensors, Inc. on January, 2023 by the United States Patent and Trademark Office.	Jentek Sensors, Inc.	Jentek Sensors, Inc.	United States Patent and Trademark Office	11543388	January 3, 2023
‌ US Patent 7280940 Segmented field dielectric sensor array for material characterization	Patent 7280940 was granted and assigned to Jentek Sensors, Inc. on October, 2007 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7280940	October 9, 2007
‌ US Patent 7230421 Damage standard fabrication with attached sensor	Patent 7230421 was granted and assigned to Jentek Sensors, Inc. on June, 2007 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7230421	June 12, 2007
‌ US Patent 8050883 Material property estimation using inverse interpolation	Patent 8050883 was granted and assigned to Jentek Sensors, Inc. on November, 2011 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	8050883	November 1, 2011
‌ US Patent 7451639 Engine blade dovetail inspection	Patent 7451639 was granted and assigned to Jentek Sensors, Inc. on November, 2008 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7451639	November 18, 2008
‌ US Patent 7467057 Material property estimation using non-orthogonal responsive databases	Patent 7467057 was granted and assigned to Jentek Sensors, Inc. on December, 2008 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7467057	December 16, 2008
‌ US Patent 7589526 Surface mounted sensor arrays having segmented primary windings	Patent 7589526 was granted and assigned to Jentek Sensors, Inc. on September, 2009 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7589526	September 15, 2009
‌ US Patent 7161351 Hidden feature characterization using a database of sensor responses	Patent 7161351 was granted and assigned to Jentek Sensors, Inc. on January, 2007 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7161351	January 9, 2007
‌ US Patent 11549831 Measurement system and method of use	Patent 11549831 was granted and assigned to Jentek Sensors, Inc. on January, 2023 by the United States Patent and Trademark Office.	Jentek Sensors, Inc.	Jentek Sensors, Inc.	United States Patent and Trademark Office	11549831	January 10, 2023
‌ US Patent 7526964 Applied and residual stress measurements using magnetic field sensors	Patent 7526964 was granted and assigned to Jentek Sensors, Inc. on May, 2009 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7526964	May 5, 2009
‌ US Patent 7188532 Self-monitoring metals, alloys and materials	Patent 7188532 was granted and assigned to Jentek Sensors, Inc. on March, 2007 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7188532	March 13, 2007
‌ US Patent 7385392 Eddy current sensing arrays and system	Patent 7385392 was granted and assigned to Jentek Sensors, Inc. on June, 2008 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7385392	June 10, 2008
‌ US Patent 7812601 Material condition assessment with eddy current sensors	Patent 7812601 was granted and assigned to Jentek Sensors, Inc. on October, 2010 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	7812601	October 12, 2010
‌ US Patent 8981018 Internal material condition monitoring for control	Patent 8981018 was granted and assigned to Jentek Sensors, Inc. on March, 2015 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	8981018	March 17, 2015
‌ US Patent 10001457 Performance curve generation for non-destructive testing sensors	Patent 10001457 was granted and assigned to Jentek Sensors, Inc. on June, 2018 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	10001457	June 19, 2018
‌ US Patent 8415947 Method for stress assessment that removes temperature effects and hysteresis on the material property measurements	Patent 8415947 was granted and assigned to Jentek Sensors, Inc. on April, 2013 by the United States Patent and Trademark Office.		Jentek Sensors, Inc.	United States Patent and Trademark Office	8415947	April 9, 2013

Results per page:

62 results

0 selected

62 results

0 selected