List of Rigaku patents

Patents where

Current Assignee

Name

Rigaku

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 10514346 X-ray fluorescence spectrometer	Patent 10514346 was granted and assigned to Rigaku on December, 2019 by the United States Patent and Trademark Office.	Rigaku	Rigaku	United States Patent and Trademark Office	10514346	December 24, 2019
‌ US Patent 7039161 Method for analyzing film structure and apparatus therefor	Patent 7039161 was granted and assigned to Rigaku on May, 2006 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7039161	May 2, 2006
‌ US Patent 7696991 Method and apparatus for analyzing twinned crystal	Patent 7696991 was granted and assigned to Rigaku on April, 2010 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7696991	April 13, 2010
‌ US Patent 10473598 X-ray thin film inspection device	Patent 10473598 was granted and assigned to Rigaku on November, 2019 by the United States Patent and Trademark Office.	Rigaku	Rigaku	United States Patent and Trademark Office	10473598	November 12, 2019
‌ US Patent 7342997 Method for measuring dead time of X-ray detector	Patent 7342997 was granted and assigned to Rigaku on March, 2008 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7342997	March 11, 2008
‌ US Patent 11782000 Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometer	Patent 11782000 was granted and assigned to Rigaku on October, 2023 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	11782000	October 10, 2023
‌ US Patent 7035373 X-ray diffraction apparatus	Patent 7035373 was granted and assigned to Rigaku on April, 2006 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7035373	April 25, 2006
‌ US Patent 11609192 Energy dispersive x-ray fluorescent spectrometer, evaluation method, and evaluation program	Patent 11609192 was granted and assigned to Rigaku on March, 2023 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	11609192	March 21, 2023
‌ US Patent 9277895 X-ray CT apparatus	Patent 9277895 was granted and assigned to Rigaku on March, 2016 by the United States Patent and Trademark Office.	Rigaku	Rigaku	United States Patent and Trademark Office	9277895	March 8, 2016
‌ US Patent 7801272 X-ray diffraction apparatus and X-ray diffraction method	Patent 7801272 was granted and assigned to Rigaku on September, 2010 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7801272	September 21, 2010
‌ US Patent 10914844 Signal processing device for X-ray analysis and adjustment method for a signal processing device for X-ray analysis	Patent 10914844 was granted and assigned to Rigaku on February, 2021 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	10914844	February 9, 2021
‌ US Patent 7352846 Filament for X-ray tube and X-ray tube having the same	Patent 7352846 was granted and assigned to Rigaku on April, 2008 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7352846	April 1, 2008
‌ US Patent 7158609 X-ray crystal orientation measuring method and X-ray crystal orientation measuring apparatus	Patent 7158609 was granted and assigned to Rigaku on January, 2007 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7158609	January 2, 2007
‌ US Patent 9442084 Optical axis adjustment method for X-ray analyzer and X-ray analyzer	Patent 9442084 was granted and assigned to Rigaku on September, 2016 by the United States Patent and Trademark Office.	Rigaku	Rigaku	United States Patent and Trademark Office	9442084	September 13, 2016
‌ US Patent 8644450 X-ray fluorescence spectrometer and X-ray fluorescence analyzing method	Patent 8644450 was granted and assigned to Rigaku on February, 2014 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	8644450	February 4, 2014
‌ US Patent 7206378 X-ray analysis apparatus	Patent 7206378 was granted and assigned to Rigaku on April, 2007 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7206378	April 17, 2007
‌ US Patent 11513086 X-ray fluorescence spectrometer	Patent 11513086 was granted and assigned to Rigaku on November, 2022 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	11513086	November 29, 2022
‌ US Patent 7098459 Method of performing analysis using propagation rays and apparatus for performing the same	Patent 7098459 was granted and assigned to Rigaku on August, 2006 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7098459	August 29, 2006
‌ US Patent 7209541 X-ray analysis apparatus	Patent 7209541 was granted and assigned to Rigaku on April, 2007 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7209541	April 24, 2007
‌ US Patent 11487043 X-ray image generation device	Patent 11487043 was granted and assigned to Rigaku on November, 2022 by the United States Patent and Trademark Office.	Rigaku	Rigaku	United States Patent and Trademark Office	11487043	November 1, 2022
‌ US Patent 10429325 X-ray small angle optical system	Patent 10429325 was granted and assigned to Rigaku on October, 2019 by the United States Patent and Trademark Office.	Rigaku	Rigaku	United States Patent and Trademark Office	10429325	October 1, 2019
‌ US Patent 8374814 X-ray detection signal processing apparatus and method therefor	Patent 8374814 was granted and assigned to Rigaku on February, 2013 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	8374814	February 12, 2013
‌ US Patent 9341583 Correction information generation method and correction information generation apparatus	Patent 9341583 was granted and assigned to Rigaku on May, 2016 by the United States Patent and Trademark Office.	Rigaku	Rigaku	United States Patent and Trademark Office	9341583	May 17, 2016
‌ US Patent 10514345 X-ray thin film inspection device	Patent 10514345 was granted and assigned to Rigaku on December, 2019 by the United States Patent and Trademark Office.	Rigaku	Rigaku	United States Patent and Trademark Office	10514345	December 24, 2019
‌ US Patent 7471766 X-ray diffraction apparatus	Patent 7471766 was granted and assigned to Rigaku on December, 2008 by the United States Patent and Trademark Office.		Rigaku	United States Patent and Trademark Office	7471766	December 30, 2008

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