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Hwa S Lee (Andrew)

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Edits on 14 Dec, 2021
"Remove inverse infobox"
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Golden AI
edited on 14 Dec, 2021
Edits made to:
Infobox (-51 properties)
Infobox
Patent primary examiner of
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US Patent 7375824 Interferometer for measurement of dome-like objects
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US Patent 7379188 Phase shift interferometer
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US Patent 7382469 Exposure apparatus for manufacturing semiconductor device, method of exposing a layer of photoresist, and method of detecting vibrations and measuring relative position of substrate during an exposure process
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US Patent 7397568 Coherent differential absorption lidar (dial)
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US Patent 7400408 Interferometric measuring device
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US Patent 7405832 Apparatus and methods for reduction and compensation of effects of vibrations and of environmental effects in wavefront interferometry
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US Patent 7417743 Interferometry systems and methods
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US Patent 7417745 Device and method for wavefront measurement of an optical imaging system by means of phase-shifting interferometry
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US Patent 7433054 Tunable Michelson and Mach-Zehnder interferometers modified with Gires-Tournois interferometers
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US Patent 7436518 Restoration of Fizeau FTS spectral data using low and/or zero spatial resolution Michelson FTS data
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US Patent 7440110 Optical sensing of measurands
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US Patent 7443509 Optical and electronic interface for optically coupled resonators
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US Patent 7466422 Method and apparatus for suppression of crosstalk and noise in time-division multiplexed interferometric sensor systems
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US Patent 7474411 System and method to reduce laser noise for improved interferometric laser ultrasound detection
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US Patent 7480056 Multi-pulse heterodyne sub-carrier interrogation of interferometric sensors
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US Patent 7480057 Interferometric device
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US Patent 7492447 Refractometer
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US Patent 7499180 Alignment stage, exposure apparatus, and semiconductor device manufacturing method
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US Patent 7502122 Fiber-optic miniature encoder for fine pitch scales
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US Patent 7508527 Apparatus and method of in situ and ex situ measurement of spatial impulse response of an optical system using phase-shifting point-diffraction interferometry
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US Patent 7511823 Fiber optic sensor
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US Patent 7511825 Pointing device
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US Patent 7515276 High resolution interferometric optical frequency domain reflectometry (OFDR) beyond the laser coherence length
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US Patent 7538886 Common path time domain optical coherence reflectometry/tomography device
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US Patent 7545510 Method of characterizing transparent thin-films using differential optical sectioning interference microscopy
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US Patent 7551288 System for monitoring bearing wear
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US Patent 7554670 Surface inspection by double pass laser doppler vibrometry
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US Patent 7557931 Optical coherence tomography method
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US Patent 7561275 Scale-factor stabilized solid-state laser gyroscope
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US Patent 7561281 System and method for controlling tube thickness
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US Patent 7564561 Method of optical frequency measurement
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US Patent 7573577 Spatial heterodyne wide-field Coherent Anti-Stokes Raman spectromicroscopy
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US Patent 7576864 Interferometric measuring device for recording geometric data for surfaces
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US Patent 7580134 Method of measuring micro-structure, micro-structure measurement apparatus, and micro-structure analytical system
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US Patent 7602498 Optical sensing of measurands
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US Patent 7602503 Methods for measuring a wavefront of an optical system
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US Patent 7609388 Spatial wavefront analysis and 3D measurement
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US Patent 7612890 System and method for controlling wafer temperature
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US Patent 7616318 Apparatus for measuring waveform of optical electric field, optical transmission apparatus connected thereto and a method for producing the optical transmission apparatus
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US Patent 7619742 High-speed spectrographic sensor for internal combustion engines
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US Patent 7636165 Displacement measurement systems lithographic apparatus and device manufacturing method
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US Patent 7639363 Electro-optic imaging Fourier transform spectrometer
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US Patent 7643150 Optical apparatus, exposure apparatus, and device manufacturing method
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US Patent 7643212 Rotationally tunable optical delay line
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US Patent 7649632 Characterization of micro- and nano scale materials by acoustic wave generation with a CW modulated laser
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US Patent 7649634 Methods and systems for white light interferometry and characterization of films
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US Patent 7652770 Optical nonliner evaluation device and optical switching element
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US Patent 7652771 Interferometer with Double Polarizing Beam Splitter
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US Patent 7652772 Systems, methods, and apparatuses of low-coherence enhanced backscattering spectroscopy
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US Patent 7652773 Enhanced detection of acousto-photonic emissions in optically turbid media using a photo-refractive crystal-based detection system
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US Patent 7679755 Tunable Michelson and Mach-Zehnder interferometers modified with Gires-Tournois interferometers
Edits on 4 Dec, 2021
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Golden AI
edited on 4 Dec, 2021
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Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7652771 Interferometer with Double Polarizing Beam Splitter
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Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7652770 Optical nonliner evaluation device and optical switching element
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Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7652772 Systems, methods, and apparatuses of low-coherence enhanced backscattering spectroscopy
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Golden AI
edited on 3 Dec, 2021
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7649634 Methods and systems for white light interferometry and characterization of films
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7643212 Rotationally tunable optical delay line
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7643150 Optical apparatus, exposure apparatus, and device manufacturing method
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Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7639363 Electro-optic imaging Fourier transform spectrometer
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7636165 Displacement measurement systems lithographic apparatus and device manufacturing method
Edits on 3 Dec, 2021
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7619742 High-speed spectrographic sensor for internal combustion engines
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7612890 System and method for controlling wafer temperature
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7609388 Spatial wavefront analysis and 3D measurement
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7602503 Methods for measuring a wavefront of an optical system
Golden AI profile picture
Golden AI
edited on 3 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7602498 Optical sensing of measurands
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Golden AI
edited on 2 Dec, 2021
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Golden AI
edited on 2 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7576864 Interferometric measuring device for recording geometric data for surfaces

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