The disclosure provides integrated circuit (IC) structure including: a substrate; a shallow trench isolation (STI) positioned between the first and second regions of the substrate; a first transistor with a channel region is positioned on the first region of the substrate, and spacer positioned on the first region of the substrate and the STI; and a gate metal positioned on the spacer. The gate metal includes a gate contact region positioned over the first source/drain region of the substrate, and surrounding the channel region. Across-couple region extends laterally from the gate contact region to the source/drain region of a second transistor formed on the second region of the substrate.