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US Patent 10346758 System analysis device and system analysis method

Patent 10346758 was granted and assigned to NEC on July, 2019 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
NEC
NEC
Current Assignee
NEC
NEC
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10346758
Patent Inventor Names
Masanao Natsumeda0
Date of Patent
July 9, 2019
Patent Application Number
14767667
Date Filed
February 24, 2014
Patent Citations Received
‌
US Patent 11474892 Graph-based log sequence anomaly detection and problem diagnosis
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US Patent 11513930 Log-based status modeling and problem diagnosis for distributed applications
‌
US Patent 11314759 In-memory catalog for searching metrics data
‌
US Patent 11314758 Storing and querying metrics data using a metric-series index
‌
US Patent 11403326 Message-based event grouping for a computing operation
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US Patent 11995562 Integrating documentation knowledge with log mining for system diagnosis
0
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US Patent 11238057 Generating structured metrics from log data
0
‌
US Patent 11243835 Message-based problem diagnosis and root cause analysis
0
...
Patent Primary Examiner
‌
Sarai E Butler
Patent abstract

In invariant relation analysis, a correlation model having high abnormality detection ability is generated.

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