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US Patent 10346758 System analysis device and system analysis method

Patent 10346758 was granted and assigned to NEC on July, 2019 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Current Assignee
NEC
NEC
Date Filed
February 24, 2014
Date of Patent
July 9, 2019
Patent Applicant
NEC
NEC
Patent Application Number
14767667
Patent Citations Received
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US Patent 11474892 Graph-based log sequence anomaly detection and problem diagnosis
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US Patent 11513930 Log-based status modeling and problem diagnosis for distributed applications
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US Patent 11314759 In-memory catalog for searching metrics data
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US Patent 11314758 Storing and querying metrics data using a metric-series index
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US Patent 11403326 Message-based event grouping for a computing operation
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US Patent 11995562 Integrating documentation knowledge with log mining for system diagnosis
0
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US Patent 11238057 Generating structured metrics from log data
0
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US Patent 11243835 Message-based problem diagnosis and root cause analysis
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US Patent 11055300 Real-time search techniques
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US Patent 11599404 Correlation-based multi-source problem diagnosis
Patent Inventor Names
Masanao Natsumeda
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10346758
Patent Primary Examiner
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Sarai E Butler

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