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US Patent 10485492 Source-detector arrangement

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Date Filed
November 10, 2015
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Date of Patent
November 26, 2019
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Patent Application Number
15524112
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Patent Citations Received
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US Patent 11996259 Patterned x-ray emitting target
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US Patent 11549895 System and method using x-rays for depth-resolving metrology and analysis
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US Patent 10989822 Wavelength dispersive x-ray spectrometer
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US Patent 11056308 System and method for depth-selectable x-ray analysis
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US Patent 11610753 Systems and methods for correction of position of focal point
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US Patent 11686692 High throughput 3D x-ray imaging system using a transmission x-ray source
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US Patent 11428651 System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
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US Patent 11885755 X-ray sequential array wavelength dispersive spectrometer
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US Patent 11992350 System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
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Patent Inventor Names
Ewald Roessl
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Peter Benjamin THeodor Noel
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Rolf Karl Otto Behling
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Thomas Koehler
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Franz Pfeiffer
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10485492
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Patent Primary Examiner
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Chih-Cheng Kao
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