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US Patent 10564231 RF windowing for magnetometry

Patent 10564231 was granted and assigned to Lockheed Martin on February, 2020 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
Lockheed Martin
Lockheed Martin
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Current Assignee
Lockheed Martin
Lockheed Martin
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
105642310
Patent Inventor Names
Peter G. Kaup0
Andrew Raymond Mandeville0
Arul Manickam0
Gregory Scott Bruce0
Stephen M. Alessandrini0
Date of Patent
February 18, 2020
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Patent Application Number
162429380
Date Filed
January 8, 2019
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Patent Citations
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US Patent 10228429 Apparatus and method for resonance magneto-optical defect center material pulsed mode referencing
Patent Citations Received
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US Patent 11774384 Spin defect magnetometry pixel array
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US Patent 11774526 Magnetometry based on electron spin defects
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US Patent 11531073 Fiber-coupled spin defect magnetometry
Patent Primary Examiner
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G. M. A Hyder
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Patent abstract

A system for magnetic detection of an external magnetic field can include a RF excitation source generating a RF excitation pulse, and an optical excitation source to generate an optical excitation pulse to apply to the magneto-optical defect center element. The system can include a controller to cause a weighting window function to be applied to the RF excitation signal to generate a corresponding weighted windowed RF excitation signal that is applied to the magneto-optical defect center element. The system can include an optical detector receiving an optical signal based on light emitted by the magneto-optical defect center element responsive to the optical excitation pulse. The controller can receive a light detection pulse from the optical detector, and generate a magnetometry curve as a function of RF excitation frequency using the light detection signal. The controller can generate a representation of a magnetic field based on the magnetometry curve.

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