US Patent 10565520 Feature extraction for machine learning

A device may receive a first command, included in a set of commands, to set a configuration parameter associated with performing feature extraction. The device may receive a second command, included in the set of commands, to set a corresponding value for the configuration parameter. The configuration parameter and the corresponding value may correspond to a particular feature metric that is to be extracted. The device may configure, based on the configuration parameter and the corresponding value, feature extraction for a corpus of documents. The device may perform, based on configuring feature extraction for the corpus, feature extraction on the corpus to determine the particular feature metric. The device may generate a feature vector based on performing the feature extraction. The feature vector may include the particular feature metric. The feature vector may include a feature identifier identifying the particular feature metric. The device may provide the feature vector.