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US Patent 10658145 High brightness x-ray reflection source

Patent 10658145 was granted and assigned to Sigray, Inc. on May, 2020 by the United States Patent and Trademark Office.

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US Patent 11996259 Patterned x-ray emitting target

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https://pdfpiw.uspto.gov/.piw?Docid=106581450

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US Patent 10153061 Metal grating for X-rays, production method for metal grating for X-rays, metal grating unit for X-rays, and X-ray imaging device

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US Patent 10352695 X-ray scatterometry metrology for high aspect ratio structures

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US Patent 10295486 Detector for X-rays with high spatial and high spectral resolution

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US Patent 10297359 X-ray illumination system with multiple target microstructures

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US Patent 10151713 X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereof

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US Patent 10074451 X-ray interferometer

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US Patent 10352880 Method and apparatus for x-ray microscopy

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US Patent 10429325 X-ray small angle optical system

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US Patent 10217596 High temperature annealing in X-ray source fabrication

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US Patent 10247683 Material measurement techniques using multiple X-ray micro-beams

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US Patent 10076297 Phase contrast X-ray tomography device

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US Patent 10028716 Differential phase-contrast imaging

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US Patent 10085701 Medical image system and joint cartilage state score determination method

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US Patent 10349908 X-ray interferometric imaging system

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US Patent 10256001 Metal grating structure for X-ray

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US Patent 10231687 Method and apparatus for enhanced X-ray computing arrays

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US Patent 10269528 Diverging X-ray sources using linear accumulation

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