Create
Log in
Sign up
Golden has been acquired by ComplyAdvantage.
Read about it here ⟶
US Patent 10866197 Dispositioning defects detected on extreme ultraviolet photomasks
Overview
Structured Data
Issues
Contributors
Activity
Access by API
Access by API
Is a
Patent
Date Filed
September 6, 2019
Date of Patent
December 15, 2020
Patent Application Number
16563763
Patent Citations
US Patent 10451563 Inspection of photomasks by comparing two photomasks
US Patent 10241390 Reflective mask blank and process for producing the reflective mask blank
US Patent 10401299 Image capturing apparatus and inspection apparatus and inspection method
US Patent 10634623 Phase contrast monitoring for extreme ultra-violet (EUV) masks defect inspection
Patent Citations Received
US Patent 11675275 Positioning method and apparatus for particles on reticle, storage medium, and electronic device
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
10866197
Patent Primary Examiner
Naum Levin
Find more entities like US Patent 10866197 Dispositioning defects detected on extreme ultraviolet photomasks
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Company
Home
Press & Media
Blog
Careers
WE'RE HIRING
Products
Knowledge Graph
Query Tool
Data Requests
Knowledge Storage
API
Pricing
Enterprise
ChatGPT Plugin
Legal
Terms of Service
Enterprise Terms of Service
Privacy Policy
Help
Help center
API Documentation
Contact Us
SUBSCRIBE