Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Shine C. Chung0
Date of Patent
February 16, 2021
0Patent Application Number
162730230
Date Filed
February 11, 2019
0Patent Citations
Patent Citations Received
Patent Primary Examiner
Patent abstract
A method of testing an OTP memory is disclosed. An OTP program mechanism that uses heat accelerated electromigration can be fully tested. In one embodiment, an OTP cell's programmability can be tested if an initial OTP element resistance is less than a predetermined resistance, as such insures that sufficient heat can be generated to be programmable. A non-destructive program state, or fake reading 1, can be created by low-voltage programming a cell while reading the same cell at the same time. Accordingly, alternative 0s and 1s patterns can be generated to fully test every functional block of an OTP memory.
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