Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
March 30, 2021
Patent Application Number
16734487
Date Filed
January 6, 2020
Patent Citations
Patent Citations Received
Patent Primary Examiner
Patent abstract
Methods for analyzing electromigration (EM) in an integrated circuit (IC) are provided. The layout of the IC is obtained. A metal segment is selected from the layout according to the current simulation result of the IC. It is determined whether to relax the EM rule on the metal segment according to the number of vias over the metal segment in the layout. The vias are in contact with the metal segment.
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