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US Patent 10979032 Time-programmable failsafe pulldown circuit for GaN switch
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Date Filed
January 8, 2020
Date of Patent
April 13, 2021
Patent Application Number
16736896
Patent Citations
US Patent 10483352 High power transistor with interior-fed gate fingers
US Patent 10720913 Integrated failsafe pulldown circuit for GaN switch
Patent Citations Received
US Patent 12126251 Transistor turn-off circuit
0
US Patent 11862630 Semiconductor device having a bidirectional switch and discharge circuit
0
US Patent 12074588 Cascode device with one or more normally-on gates
0
US Patent 11855635 Transistor DV/DT control circuit
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
10979032
Patent Primary Examiner
Diana J. Cheng
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