US Patent 10983546 Circuits and methods providing bandgap calibration

A system includes a bandgap voltage generator coupled to a voltage supply and configured to produce a plurality of reference voltage levels in response to a plurality of calibration codes; an analog-to-digital converter (ADC) coupled to a reference voltage output of the bandgap voltage generator; a logic circuit coupled to an output of the ADC; a first memory element coupled to the logic circuit and configured to store a calibration coefficient indicative of a relationship of the calibration codes and the reference voltage levels; and a second memory element coupled to the logic circuit and configured to store a value of a first reference voltage level for the reference voltage output, wherein the logic circuit is configured to generate a first calibration code from the value of the first reference voltage level and the calibration coefficient.