US Patent 11334101 Circuits and methods providing bandgap calibration for multiple outputs

A method and an apparatus to provide bandgap calibration for multiple outputs are disclosed. In one implementation, a computing chip includes a bandgap current generator; a first adjustable current output coupled to the bandgap current generator; a second adjustable current output coupled to the bandgap current generator; a first switch selectively coupling the first adjustable current output to a calibration circuit and to a first analog-to-digital converter (ADC); and a second switch selectively coupling the second adjustable current output to a load on the computing chip and to the ADC.