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US Patent 11030381 Leakage analysis on semiconductor device

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
September 27, 2019
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Date of Patent
June 8, 2021
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Patent Application Number
16586658
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Patent Citations
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US Patent 10832958 Leakage reduction methods and structures thereof
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US Patent 10867115 System and method for calculating cell edge leakage
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US Patent 10276445 Leakage reduction methods and structures thereof
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US Patent 10467374 System and method for calculating cell edge leakage
Patent Citations Received
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US Patent 11714949 Leakage analysis on semiconductor device
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Patent Inventor Names
Yun-Xiang Lin
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Cheng-Hua Liu
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Chung-Hsing Wang
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Yuan-Te Hou
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11030381
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Patent Primary Examiner
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Helen Rossoshek
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