US Patent 11177111 Defect observation device
Patent 11177111 was granted and assigned to Hitachi on November, 2021 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
March 20, 2020
0
Date of Patent
November 16, 2021
0
Patent Applicant
Patent Application Number
16824872
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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