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US Patent 11181490 Small-angle x-ray scatterometry
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Patent
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Date Filed
July 4, 2019
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Date of Patent
November 23, 2021
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Patent Application Number
17254281
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Patent Citations Received
US Patent 12007343 X-ray beam shaping apparatus and method
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US Patent 11781999 Spot-size control in reflection-based and scatterometry-based X-ray metrology systems
Patent Inventor Names
Matthew Wormington
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Alex Dikopoltsev
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Alexander Krokhmal
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Yuri Vinshtein
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11181490
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Patent Primary Examiner
Hoon K Song
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