US Patent 11189392 X-ray microscope
Patent 11189392 was granted and assigned to Osaka University on November, 2021 by the United States Patent and Trademark Office.
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Patent abstract
An X-ray microscope includes at least one of an X-ray source, a sample holding part, a concave Kirkpatrick-Baez mirror, a convex Kirkpatrick-Baez mirror, and a light receiving part located at a position in an imaging relation to a position of the sample holding part in this order along an optical axis.
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Patent Number
111893920
Date of Patent
November 30, 2021
0Patent Application Number
157599220
Date Filed
September 23, 2016
0Official Website
Patent Citations Received
Patent Primary Examiner
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Is a
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
111893920
Date of Patent
November 30, 2021
0Patent Application Number
157599220
Date Filed
September 23, 2016
0Official Website
Patent Primary Examiner
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US Patent 11189392 X-ray microscope
Infobox
Is a
Patent applicant
Current assignee
Patent jurisdiction
Patent number
11189392
Date of patent
November 30, 2021
Patent application number
15759922
Date Filed
September 23, 2016
Patent primary examiner
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