Patent attributes
A system and method of calibrating a measuring instrument is provided. The system includes a support system for quickly and easily securing a low thermal expansion length reference bar in position. The reference bar is coupled to the support beam using a kinematic mounting system that is designed to reduce or eliminate errors associated with over-constraining the reference bar. The system is optimized for field calibration of certain measuring instruments, such as measuring instruments having articulating arms. Opposed first and second ends of the reference bar include respective first and second retroflectors and/or first and second probe receivers at known distances relative to each other, thereby facilitating calibration of the measuring instrument.
