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US Patent 11754387 Noncontact sensor calibration using single axis movement

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Is a

Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

Patent Inventor Names

Ethan James Shepherd

Parag P. Wagaj

Date of Patent

September 12, 2023

Patent Application Number

17310687

Date Filed

March 6, 2020

Patent Citations

US Patent 11585766 CT scanner calibration

US Patent 11231273 Articulating arm calibration artifact system and method of use

US Patent 11402201 Coordinate positioning apparatus and method of operation

US Patent 7712224 Validating the error map of CMM using calibrated probe

US Patent 7900367 Differential calibration

US Patent 7908756 Integrated calibration sphere and calibration step fixture for improved coordinate measurement machine calibration

US Patent 10323927 Calibration of a triangulation sensor

US Patent 10401162 Calibration of measurement probes

Patent Primary Examiner

George B Bennett

CPC Code

A probe calibration method and calibration artifact (

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