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US Patent 11754387 Noncontact sensor calibration using single axis movement
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Patent
Date Filed
March 6, 2020
Date of Patent
September 12, 2023
Patent Application Number
17310687
Patent Citations
US Patent 11585766 CT scanner calibration
US Patent 11231273 Articulating arm calibration artifact system and method of use
US Patent 11402201 Coordinate positioning apparatus and method of operation
US Patent 7712224 Validating the error map of CMM using calibrated probe
US Patent 7900367 Differential calibration
US Patent 7908756 Integrated calibration sphere and calibration step fixture for improved coordinate measurement machine calibration
US Patent 10323927 Calibration of a triangulation sensor
US Patent 10401162 Calibration of measurement probes
Patent Inventor Names
Ethan James Shepherd
Parag P. Wagaj
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11754387
Patent Primary Examiner
George B Bennett
CPC Code
G01B 21/042
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