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US Patent 11391934 Sample observation device and sample observation method

Patent 11391934 was granted and assigned to Hamamatsu Photonics on July, 2022 by the United States Patent and Trademark Office.

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Patent

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Patent Applicant

Hamamatsu Photonics

Current Assignee

Hamamatsu Photonics

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

11391934

Date of Patent

July 19, 2022

Patent Application Number

17411533

Date Filed

August 25, 2021

Patent Citations Received

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US Patent 11852792 Sample observation device

Patent Primary Examiner

CPC Code

A sample observation device (

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