US Patent 11391934 Sample observation device and sample observation method
Patent 11391934 was granted and assigned to Hamamatsu Photonics on July, 2022 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
August 25, 2021
Date of Patent
July 19, 2022
Patent Applicant
Patent Application Number
17411533
Patent Citations Received
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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