Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Chandrashekhar Prakash Savant0
Yu-Ming Lin0
Ming-Hsi Yeh0
Kuo-Feng Yu0
Clement Hsingjen Wann0
Chun Hsiung Tsai0
Chih-Hsin Ko0
Shahaji B. More0
Date of Patent
August 2, 2022
0Patent Application Number
171680470
Date Filed
February 4, 2021
0Patent Citations Received
Patent Primary Examiner
In a method of manufacturing a semiconductor device, a fin structure is formed by patterning a semiconductor layer, and an annealing operation is performed on the fin structure. In the patterning of the semiconductor layer, a damaged area is formed on a sidewall of the fin structure, and the annealing operation eliminates the damaged area.
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