US Patent 11408761 Measurement method, measurement device, measurement system, and measurement program
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Yoshihiro Kobayashi0
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Patent Number
114087610
Date of Patent
August 9, 2022
0Patent Application Number
172039720
Date Filed
March 17, 2021
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US Patent 11408761 Measurement method, measurement device, measurement system, and measurement program
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A measurement method includes: a physical quantity acquisition step of acquiring, based on observation information obtained by at least one observation device that observes first to N-th observation points of a structure arranged along a second direction intersecting a first direction in which a moving object moves along the structure, physical quantities at the first to N-th observation points; and an action calculation step of calculating actions x
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Patent jurisdiction
Patent number
11408761
Date of patent
August 9, 2022
Patent application number
17203972
Date Filed
March 17, 2021
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