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US Patent 11422185 System and method for testing critical components on system-on-chip

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Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11422185
Date of Patent
August 23, 2022
Patent Application Number
16917663
Date Filed
June 30, 2020
Patent Citations
‌
US Patent 10909284 Method and system for selection of location for placement of trojans, triggers and instruments within integrated circuits and electronic systems using weighted controllability and observability analysis
‌
US Patent 10643011 Automatic design and verification of safety critical electronic systems
‌
US Patent 10078565 Error recovery for redundant processing circuits
Patent Primary Examiner
‌
Guerrier Merant

A system-on-chip (SoC) includes multiple critical components and a testing system to test the critical components. The critical components include an intellectual property (IP) core and an associated logic circuit. The testing system includes a controller, a fault injector, and a masking circuit. The controller is configured to receive a test initiation request and generate first and second select instructions. The fault injector is configured to generate and inject a set of fault inputs in the logic circuit based on the first select instruction to test the associated logic circuit and the IP core. The IP core is configured to generate a set of responses that is associated with the testing of the logic circuit and the associated IP core. The masking circuit is configured to mask and output the set of responses when the second select instruction indicates a first value and a second value, respectively.

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