Patent 11561257 was granted and assigned to Allegro Microsystems, Llc on January, 2023 by the United States Patent and Trademark Office.
A method for testing a signal path in a sensor, the signal path including a filter circuit and a comparator circuit, the method including: closing a first signal line that is arranged to bypass a first capacitor in the filter circuit; injecting a test signal into the signal path after the first signal line is closed; and detecting whether a signal that is output by the comparator circuit in response to the test signal satisfies a predetermined condition.