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US Patent 11640959 Semiconductor device
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Patent
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Date Filed
July 17, 2020
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Date of Patent
May 2, 2023
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Patent Application Number
16931585
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Patent Citations
US Patent 10128241 Integrated circuit devices
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US Patent 11282829 Integrated circuit with mixed row heights
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US Patent 10026661 Semiconductor device for testing large number of devices and composing method and test method thereof
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US Patent 11222158 Method and computing system for manufacturing integrated circuit including nanosheet
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Patent Inventor Names
Yoonjin Kim
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Jungkyu Chae
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Kwanyoung Chun
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11640959
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Patent Primary Examiner
Mounir S Amer
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CPC Code
H01L 27/0207
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