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US Patent 11662380 Built-in self-test for die-to-die physical interfaces
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Patent
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Current Assignee
Apple (company)
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Date Filed
May 13, 2021
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Date of Patent
May 30, 2023
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Patent Applicant
Apple (company)
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Patent Application Number
17320165
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Patent Citations
US Patent 9121894 Three-dimensional integrated circuit and testing method for the same
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US Patent 7296202 Semiconductor module with a configuration for the self-test of a plurality of interface circuits and test method
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US Patent 7653505 Method and apparatus for testing a controlled impedance buffer
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US Patent 8832511 Built-in self-test for interposer
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US Patent 9423454 Test circuit and semiconductor apparatus including the same
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11662380
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Patent Primary Examiner
Cynthia Britt
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CPC Code
G01R 31/31723
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G01R 31/2889
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G01R 31/31926
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G01R 31/3177
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G01R 31/66
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G01R 31/31713
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G01R 31/31725
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G01R 31/31712
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G01R 31/318572
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