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US Patent 11663387 Fault diagnostics

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Current Assignee
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Date Filed
July 19, 2021
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Date of Patent
May 30, 2023
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Patent Applicant
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Patent Application Number
17379256
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Patent Citations
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US Patent 11068633 Fault diagnostics
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US Patent 10657207 Inter-cell bridge defect diagnosis
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US Patent 8120939 ROM cell having an isolation transistor formed between first and second pass transistors and connected between a differential bitline pair
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US Patent 9286969 Low power sense amplifier for static random access memory
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US Patent 9318476 High performance standard cell with continuous oxide definition and characterized leakage current
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US Patent 10467374 System and method for calculating cell edge leakage
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US Patent 10592625 Cell-aware root cause deconvolution for defect diagnosis and yield analysis
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11663387
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Patent Primary Examiner
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Naum Levin
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CPC Code
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G06F 30/333
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G06F 30/33
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G06F 30/39
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G06F 30/392
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