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US Patent 11668825 Measurement apparatus and control method of measurement apparatus

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Patent Applicant
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Current Assignee
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
116688250
Date of Patent
June 6, 2023
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Patent Application Number
167464660
Date Filed
January 17, 2020
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Patent Citations
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US Patent 10809360 Laser scanner
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US Patent 7412022 Non-invasive stationary system for three-dimensional imaging of density fields using periodic flux modulation of compton-scattered gammas
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US Patent 10697758 Laser remote length measurement instrument
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US Patent 10895632 Surveying system
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Patent Primary Examiner
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Zaihan Jiang
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CPC Code
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G01S 17/08
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G01S 17/89
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An apparatus and method are provided that can identify an array direction of a measurement object formed in a linear shape and efficiently perform a localized measurement of the measurement object. A measurement apparatus includes a distance measuring unit, a deflecting unit which deflects a direction of emission of measurement light with respect to a reference optical axis and which is capable of performing scanning with the measurement light with respect to a prescribed center in a circumferential direction, and a calculation control unit which controls the distance measuring unit and the deflecting unit. The calculation control unit detects coordinates of intersection points of a measurement object formed in a linear shape and a scanned trajectory of the measurement light with the basis of a distance measurement result by the distance measuring unit and the direction of emission that is deflected by the deflecting unit, and identifies an array direction of the measurement object on the basis of the coordinates of a plurality of intersection points.

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