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US Patent 11668825 Measurement apparatus and control method of measurement apparatus
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Patent
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Current Assignee
Topcon
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Date Filed
January 17, 2020
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Date of Patent
June 6, 2023
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Patent Applicant
Topcon
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Patent Application Number
16746466
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Patent Citations
US Patent 10809360 Laser scanner
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US Patent 7412022 Non-invasive stationary system for three-dimensional imaging of density fields using periodic flux modulation of compton-scattered gammas
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US Patent 10697758 Laser remote length measurement instrument
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US Patent 10895632 Surveying system
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11668825
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Patent Primary Examiner
Zaihan Jiang
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CPC Code
G01S 17/08
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G01S 17/89
0
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