Log in
Sign up
Golden has been acquired by ComplyAdvantage.Read about it here ⟶
‌

US Patent 11699017 Die yield assessment based on pattern-failure rate simulation

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
August 23, 2019
0
Date of Patent
July 11, 2023
0
Patent Application Number
17417223
0
Patent Citations
‌
US Patent 9064087 Semiconductor device reliability model and methodologies for use thereof
0
‌
US Patent 10539611 Integrated circuit chip reliability qualification using a sample-specific expected fail rate
0
‌
US Patent 9639645 Integrated circuit chip reliability using reliability-optimized failure mechanism targeting
0
‌
US Patent 11354484 Failure model for predicting failure due to resist layer
0
‌
US Patent 7941768 Photolithographic process simulation in integrated circuit design and manufacturing
0
‌
US Patent 8856698 Method and apparatus for providing metric relating two or more process parameters to yield
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
11699017
0
Patent Primary Examiner
‌
Leigh M. Garbowski
0

Find more entities like US Patent 11699017 Die yield assessment based on pattern-failure rate simulation

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo