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US Patent 11747509 Three-dimensional X-ray baggage scanner
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Patent
Date Filed
August 29, 2019
Date of Patent
September 5, 2023
Patent Application Number
17272305
Patent Citations
US Patent 7965816 Scanning X-ray inspection system using scintillation detection with simultaneous counting and integrating modes
US Patent 10254436 Scanning system, method, and corresponding bracket
Patent Inventor Names
Kapil Bardeja
Rajeev Ranjan Dixit
Anoop G Prabhu
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11747509
Patent Primary Examiner
Irakli Kiknadze
CPC Code
G01N 23/046
G01N 2223/419
G01N 23/083
G01N 23/06
G01N 23/02
G01N 23/20083
G01N 23/20
G01N 23/223
G01N 2223/076
G01N 23/087
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